Spectral Response System
The PVE300 system is a monolithic, turnkey solution for photovoltaic device research in industry and academia, permitting the quick and accurate characterisation of photovoltaic devices and materials.
Backed by Bentham’s extensive experience in the field of light measurement, this system can be configured to cover the spectral range and device type of your choice.
SYSTEM SPECIFICATIONS
| MONOCHROMATIC PROBE | |
| Probe light source: | Quartz halogen and/or Xenon |
| Probe light source: | Quartz halogen and/or Xenon |
| Monochromator configuration: | Symmetric, single Czerny-Turner |
| Monochromator focal length: | 300mm |
| Bandwidth: | Adjustable fixed slit, 1-10nm typical |
| Number of gratings: | 1-3 mounted on turret |
| Resolution: |
0.3nm (1200g/mm) 0.6nm (600g/mm) |
| Dispersion: |
2.7nm/mm (1200g/mm) 5.4nm/mm (600g/mm) |
| Wavelength accuracy: |
± 0.2nm (1200g/mm) ± 0.4nm (600g/mm) |
| Probe imaging system: | Mirror–based |
| Probe size: | 1-10mm |
| SAMPLE MOUNT | |
| Temperature control | Peltier-based heat pump |
| Temperature stability | ± 1°C |
| SOLAR SIMULATOR | |
| Transport to sample | Branched fibre bundle |
| Bias source irradiance | 0-1.5 suns |
| Bias source uniformity | ±1% over 1 cm2 |
| DETECTION ELECTRONICS | |
| Reference calibrators |
Silicon 300-1100nm Germanium 800-1800nm |
| Maximum photocurrent |
Transformer ~1A 477 amplifier ~100mA |
| Minimum responsivity (transformer) | 0.03 A W-1 nm-1 5nm BW, 2mm probe typ. |
| SOFTWARE | |
| Software control | BenWin+ Windows application |
| MEASUREMENT CAPABILITIES | |
| Spectral response, S(λ) (A W-1) | Absolute spectral response of device |
| External quantum efficiency, EQE(λ) (%) | Determined from absolute spectral response = 1.24x105xS(λ)/λ (nm). Also termed IPCE. |
| Sample reflectance, R(λ) (%) | Total reflectance of sample (diffuse and specular) |
| Sample transmittance, T(λ) (%) | Diffuse transmission of sample |
| Internal quantum efficiency, IQE(λ) (%) | EQE modified by (1-T(λ) -R(λ) ) to account only for photons reaching active region |
SYSTEM COMPONENTS
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Dual Source input to monochromator consisting of a 75W Xe (UV-Vis) and 100W QH lamp (Vis-IR) with computer controlled selection mirror and optical chopper. | |
| TMc300 single monochromator provides chopped, monochromatic probe for measurement of responsivity, transmittance and reflectance. |  |
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Mirror-based relay optic images the exit port of the monochromator (circular aperture) onto the sample plane, 1-10mm diameter. |
The PVE300 reunites the probe source and the solar simulator at the sample plane where the temperature-controlled vacuum chuck is situated. A diverting mirror is inserted to relay the probe to an integrating sphere for the measurement of transmittance and reflectance.
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Transformer coupling from the device under test decouples DC bias–generated signal from that from AC probe. |
| Temperature controlled vacuum chuck configured here for substrate devices, showing sample probing and solar simulator illuminated. |  |
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A variable intensity solar simulator with computer controlled shutter is mounted to wall of the PVE300, with light transported via six-branch fibre. |
| An integrating sphere with relay mirror to perform measurements of diffuse transmittance and diffuse & specular reflectance. |  |
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The 417 unit houses the ensemble of detection electronics of this system; amplifiers, lock-in, and chopper controller. |
| For each light source is required a 605 constant current supply, situated outside the enclosure. These devices have excellent stability to ensure constant lamp output. |  |
A GUIDE TO OPTIONS & TECHNOLOGIES
This PVE300 is a modular and configurable system to adapt to the measurement requirements of the PV technology to be studied. The following provides a guide to the options and the technologies to which they are best suited:
